Projet ANR AMOS : publications AMOS

Publications

1. Béché A, Rouvière JL, Barnes JP, Cooper D.
Strain measurement at the nanoscale: comparison between convergent beam electron diffraction, nano-beam electron diffraction, high resolution imaging and dark field electron holography
Ultram. 131 (2013) 10-23.

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2. Brunetti, D Robert, P Bayle-Guillemaud, JL Rouvière, EF Rauch, JF Martin, JF Colin, F Bertin and C Cayron
Confirmation of the Domino-Cascade model by LiFePO4/FePO4 Precession Electron Diffraction
Chem. Materials (2011) 23 (20) 4515

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3. Rouviere JL, Béché A, Martin Y, Thibaud Denneulin T, Cooper D
Improved strain precision with high spatial resolution using precession nanobeam electron diffraction
Appl. Phys. Lett. 103 (2014) 241913.

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4. Wang YY, Bruley J, Meer H van, Li J, Domenicucci A, Murray CE, Rouviere JL

Strain mapping of Si devices with stress memorization processing.

Appl. Phy. Lett. 103 (2013) 052104.

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5. Cooper D, Denneulin T, Barnes J-P, Hartmann J.-M., Hutin L., Le Royer C, Béché A., Rouvière J.-L.
Strain mapping with nm-scale resolution for the silicon-on-insulator generation of semiconductor devices by advancedelectron microscopy.
J. of Appl. Phys 112, (2012) 124505

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6. D. Robert, T. Douillard, A. Boulineau, G. Brunetti, P.Nowakowski, D. Venet, P.Bayle-Guillemaud and C.l Cayron
Multiscale Phase Mapping of LiFePO4-Based Electrodes by Transmission Electron Microscopy and Electron Forward Scattering Diffraction
ACS NANO 7 (2013) 10887-10894.

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7. Robach O., Micha, J.S., Ulrich O., Gergaud P.

Full local elastic strain tensor from Laue microdiffraction: simultaneous Laue pattern and spot energy measurement

J. of Appl. Cryst, 44 688-696 (2011).

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8. Robach, J.-S. Micha, O. Ulrich, O. Geaymond, O. Sicardy, J. Härtwig and F. Rieutord
A tunable multicolour `rainbow' filter for improved stress and dislocation density field mapping in polycrystals using X-ray Laue microdiffraction
Acta Cryst. (2013). A69, 164-170.

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9. D. Ferreira Sancheza, D. Laloum, M. Larissa Djomeni Weleguela, O. Ulrich, G. Audoit, A. Grenier, J.-S. Micha, O. Robach, F. Lorut, P. Gergaud, P. Bleuet, X-ray µ-Laue diffraction analysis of Cu through-silicon vias: a 2D and 3D study
under submission (2014).

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10. Villanova J., Maurice C., Micha J.S., Bleuet P., Sicardy O., Fortunier R.
Multiscale measurements of residual strains in a stabilized zirconia layer
J. Appl. Cryst. (2012). 45, 926–935

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11. Maurice C., Driver J.H. and Fortunier R.
On solving the orientation gradient dependency of high angular resolution EBSD
Ultramicroscopy 113 (2012) 171-181.

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12. Maurice C., Quey R., Fortunier R., Driver J.H.

High Angular Resolution EBSD and Its Material Applications

In book: Microstructural Design of Advanced Engineering Materials, Chapter: 14, Publisher: Wiley, Editors: Dmitri A. Molodov, 341-365.

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13. Zhang, Z Rauch E.F. Véron. M
Twinning analyses in a magnesium alloy with tilting series scanning method using a TEM based orientation mapping system
Materials Letters 11 (2013) 192-196.

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14.

pdf	Poster AMOS J3N UltJ3N Strasbourg 7-9 novembre 2011
pdf	C. MAURICE, K. DZIECIOL, R. FORTUNIER A method for accurate localisation of EBSD pattern centres Ultramicroscopy 111 (2011) 140-148

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Projet ANR : AMOS

Publications